Development of secondary ion mass spectroscopy using medium energy C ion impact

平田 浩一*; 齋藤 勇一; 千葉 敦也; 阿達 正浩*; 山田 圭介; 鳴海 一雅

Nuclear Instruments and Methods in Physics Research B, 266(10), p.2450 - 2452, 2008/05

https://doi.org/10.1016/j.nimb.2008.03.019

Time-of-flight (TOF) secondary ion mass spectroscopy was performed using primary C ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C (120 keV C and 540 keV C) impacts than those for low energy C (30 keV C) impacts. This finding demonstrates that medium energy C ion impacts are useful for highly sensitive characterization of amino acids.